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The 25th International Conference on Microelectronic Test Structures brings together designers and users of test structures to discuss recent developments and future directions. It will be held at the Catamaran Hotel in San Diego, California, USA, on 20th March, 2012. The deadline for abstracts submission is 16th September 2011

The IEEE Electron Devices Society sponsors the 25th International Conference on Microelectronic Test Structures, bringing together designers and users of test structures to discuss recent developments and future directions. The conference will be held at the Catamaran Hotel in San Diego, California, USA, on March 20–22, 2012. The Conference will be preceded by a one-day Tutorial Short Course on Microelectronic Test Structures on March 19, 2012.

There will also be an equipment exhibition relating to test structure measurements and related services. Original papers are solicited presenting new developments in test structures, their implementation, and/or application in the fields of silicon, compound semiconductor, nanotechnology, and MEMS research.

This includes their implementation and applications, as well as test structures aimed at the characterization of new materials and devices. A Best Paper award will be presented by the Technical Program Committee.

For more information, please contact wendyw@widerkehr.com

Associated websites:

• Conference Homepage